| Seminar Content
This seminar offers insights into the speed vs. accuracy trade-offs involved in making multi-channel measurements with a digital multimeter (DMM) and relay switching. We'll explore the various interactions between these instruments, such as signal errors caused by switching hardware, improper instrument coordination, measurement compensation techniques, and automated scanning. By participating in this seminar, you will learn and understand: - Practical considerations for selecting the right type of DMM and switching hardware
- Sources of measurement errors
- Impact of relay settling time on measurement performance
- Typical configuration, measurement, and optimization techniques
About the Presenter: Jerry Janesch is a Marketing Manager at Keithley Instruments, Inc., headquartered in Cleveland, Ohio. He earned a Bachelor degree in Electrical Engineering from Fenn College of Engineering and a Master of Business Administration from John Carroll University. He has been employed by Keithley for seven years.
This seminar is recommended for engineers and technicians in areas such as functional and production testing, quality assurance, failure analysis, and reliability testing.
This informative 60-minute technical seminar includes interactive Q&A (Questions and Answers; during live broadcast only). |
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